Metrological scanning probe microscope based on a quartz tuning fork detector
نویسندگان
چکیده
منابع مشابه
Calibrating a tuning fork for use as a scanning probe microscope force sensor.
Quartz tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface inte...
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Multi-frequency scanning near-field optical microscopy, based on a quartz tuning fork-probe (QTF-p) sensor using the first two orders of in-plane bending symmetrical vibration modes, has recently been developed. This method can simultaneously achieve positional feedback (based on the 1st in-plane mode called the low mode) and detect near-field optically induced forces (based on the 2nd in-plane...
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The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملAtomic resolution ultrafast scanning tunneling microscope with scan rate breaking the resonant frequency of a quartz tuning fork resonator.
We present an ultra-fast scanning tunneling microscope with atomic resolution at 26 kHz scan rate which surpasses the resonant frequency of the quartz tuning fork resonator used as the fast scan actuator. The main improvements employed in achieving this new record are (1) fully low voltage design (2) independent scan control and data acquisition, where the tuning fork (carrying a tip) is blindl...
متن کاملPiezoelectric Quartz Tuning Forks for Scanning Probe Microscopy
In this paper the application of piezoelectric quartz tuning forks in dynamic force microscopy is described. For the introduction we give a historical overview and a comparison with traditional cantilevers. In the second section the theories for tuning forks as oscillators for the dynamic force detection are introduced and in the third section the experimental implementation is described. This ...
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ژورنال
عنوان ژورنال: Journal of Micro/Nanolithography, MEMS, and MOEMS
سال: 2012
ISSN: 1932-5150
DOI: 10.1117/1.jmm.11.1.011003